1C8051F590单片机特征：
　　Analog Peripherals
　　12-Bit ADC, 5 V input signal; up to 32 external inputs
　　- ±1 LSB INL; guaranteed monotonic
　　- Programmable throughput up to 200 ksps
　　- Data-dependent windowed interrupt generator
　　- Programmable gain maximizes input signal span
　　Built-in Temperature Sensor (±3 °C)
　　Three Comparators
　　Precision Internal Voltage Reference
　　VDD Monitor/Brown-out Detector
　　On-Chip Debug
　　- On-chip debug circuitry facilitates full speed, non-intrusive in-system
　　debug (no emulator required)
　　- Provides breakpoints, single stepping, watch-points
　　- Inspect/modify memory, registers, and stack
　　- Superior performance to emulation systems using ICE-chips, target
　　pods, and sockets
　　Temperature Range: –40 to +125 °C
　　Operating Voltage: 1.8 to 5.25 V
　　- Multiple power saving sleep and shutdown modes
　　Development Kit: C8051F580DK
　　High-Speed 8051 μC Core
　　- Pipelined instruction architecture; executes 70% of instructions in one or
　　two system clocks
　　- Up to 50 MIPS throughput
　　Memory
　　- 96 kB Flash; in-system programmable; flexible security features
　　- 8448 bytes data RAM (256 + 8 kB)
　　CAN 2.0B
　　- 32 message objects
　　LIN 2.1
　　- Master or slave operation using dedicated hardware
　　Digital Peripherals
　　- Up to 33 digital I/O; all are 5 V push-pull
　　- Hardware I2C, SPI?, and two UART serial ports available concurrently
　　- Two independent programmable 16-bit counter array with six capture/
　　compare modules
　　- Six general-purpose 16-bit counter/timers
　　- External Memory Interface (EMIF)
　　Clock Sources
　　- Internal programmable ±0.5% oscillator: Up to 50 MHz
　　- External oscillator: Crystal, RC, C, or CMOS Clock
　　Ordering Part Numbers
　　-C8051F590-IM, 40-Pin QFN (RoHS-comp liant), 6 x 6 mm2